ESDA ANSI/ESD SP5.4.1-2022

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ESD Association Standard Practice for Latch-up Sensitivity Testing of CMOS/BiCMOS Integrated Circuits – Transient Latch-up Testing – Device Level

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ESDA ANSI/ESD SP5.4.1-2022

ESD Association Standard Practice for Latch-up Sensitivity Testing of CMOS/BiCMOS Integrated Circuits – Transient Latch-up Testing – Device Level

PUBLISH DATE 2022
ESDA ANSI/ESD SP5.4.1-2022
This document defines procedures to characterize the latch-up sensitivity of integrated circuits triggered by fast transients.
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