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IEC 60444-11 Ed. 2.0 en:2026

Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff</sub> using automatic network analyzer techniques and error correction
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IEC 60444-11 Ed. 2.0 en:2026

Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff</sub> using automatic network analyzer techniques and error correction

PUBLISH DATE 2026
IEC 60444-11 Ed. 2.0 en:2026
IEC 60444-11:2026 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.
This edition includes the following significant technical changes with respect to the previous edition:
a) key content of withdrawn IEC TR 60444-4 is reproduced as Annex A;
b) some formulae in the first edition have been corrected.
SDO IEC: International Electrotechnical Commission
Document Number IEC 60444
Publication Date April 1, 2026
Language en - English
Page Count 32
Revision Level 2.0
Supercedes
Committee 49
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