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IEC 60512-27-100 Ed. 1.0 b:2011

Connectors for electronic equipment - Tests and measurements - Part 27-100: Signal integrity tests up to 500 MHz on 60603-7 series connectors - Tests 27a to 27g
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IEC 60512-27-100 Ed. 1.0 b:2011

Connectors for electronic equipment - Tests and measurements - Part 27-100: Signal integrity tests up to 500 MHz on 60603-7 series connectors - Tests 27a to 27g

PUBLISH DATE 2011
PAGES 144
IEC 60512-27-100 Ed. 1.0 b:2011
Connectors for electronic equipment - Tests and measurements - Part 27-100: Signal integrity tests up to 500 MHz on 60603-7 series connectors - Tests 27a to 27g
IEC 60512-27-100:2011 specifies the test methods for transmission performance for IEC 60603-7 series connectors up to 500 MHz. It is also suitable for testing lower frequency connectors if they meet the requirements of the detail specifications and of this standard. The test methods provided are:
- insertion loss,
- return loss,
- near-end crosstalk (NEXT),
- far-end crosstalk (FEXT),
- transverse conversion loss (TCL) and
- transverse conversion transfer loss (TCTL). For the transfer impedance (Zt) test, see IEC 60512-26-100 and for the coupling attenuation, see IEC 62153-4-12.
SDO IEC: International Electrotechnical Commission
Document Number IEC 60512
Publication Date Dec. 1, 2011
Language b - English & French
Page Count 144
Revision Level 1.0
Supercedes
Committee 48B
Publish Date Document Id Type View
Dec. 1, 2011 IEC 60512-27-100 Ed. 1.0 b:2011 Revision
Dec. 1, 2011 Revision