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IEC 60512-6-2 Ed. 1.0 b:2002

Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump
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IEC 60512-6-2 Ed. 1.0 b:2002

Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump

PUBLISH DATE 2002
PAGES 18
IEC 60512-6-2 Ed. 1.0 b:2002
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump
SDO IEC: International Electrotechnical Commission
Document Number IEC 60512
Publication Date Feb. 1, 2002
Language b - English & French
Page Count 18
Revision Level 1.0
Supercedes
Committee 48B
Publish Date Document Id Type View
Feb. 1, 2002 Revision
Feb. 1, 2002 IEC 60512-6-2 Ed. 1.0 b:2002 Revision