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IEC 60747-14-1 Ed. 2.0 b:2010

Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
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IEC 60747-14-1 Ed. 2.0 b:2010

Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors

PUBLISH DATE 2010
PAGES 46
IEC 60747-14-1 Ed. 2.0 b:2010
Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
IEC 60147-14-1:2009 describes general items concerning the specifications for sensors, which are the basis for specifications given in other parts of this series for various types of sensors. Sensors described in this standard are basically made of semiconductor materials, however, the statements made in this standard are also applicable to sensors using materials other than semiconductor, for example dielectric and ferroelectric materials. The major changes with regard to the previous edition are as follows: a) Title change from "Semiconductor sensors - General and classification" to "Semiconductor sensors - Generic specification for sensors"; b) Clause 3 has been divided into three Clauses 3, 4 and 5; c) Added new terms from IEC 60747-14-5; d) Added a new Clause relating to Quality assessment procedures; e) Added a Bibliography; f) Added a new Annex for the sampling procedure.
SDO IEC: International Electrotechnical Commission
Document Number IEC 60747
Publication Date Jan. 1, 2010
Language b - English & French
Page Count 46
Revision Level 2.0
Supercedes
Committee 47E
Publish Date Document Id Type View
Jan. 1, 2010 IEC 60747-14-1 Ed. 2.0 b:2010 Revision
Jan. 1, 2010 Revision