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IEC 60747-5-14 Ed. 1.0 en:2022

Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
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IEC 60747-5-14 Ed. 1.0 en:2022

Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method

PUBLISH DATE 2022
PAGES 26
IEC 60747-5-14 Ed. 1.0 en:2022
Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
IEC 60747-5-14:2022(E) specifies the measuring method of the surface temperature of single LED die or package, based on the thermoreflectance (TR) method. TR is the effect that the reflectance of light changes with the temperature of a substance. This part measures relative change in the reflectance of light from a metal film deposited nearby on the metallurgical pn junction as the relative change in the LED junction temperature. The surface temperature can be approximated as the junction temperature when the thermal resistance effect between the metal surface and the pn junction is negligibly small.
SDO IEC: International Electrotechnical Commission
Document Number IEC 60747
Publication Date March 1, 2022
Language en - English
Page Count 26
Revision Level 1.0
Supercedes
Committee 47E
Publish Date Document Id Type View
March 1, 2022 IEC 60747-5-14 Ed. 1.0 en:2022 Revision
March 1, 2022 Revision