IEC 60749-18 Ed. 2.0 b:2019

Current Revision

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

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IEC 60749-18 Ed. 2.0 b:2019

Name: IEC 60749-18 Ed. 2.0 b:2019 – Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Brand: International Electrotechnical Commission
SKU: IEC 60749-18 Ed. 2.0 b:2019
Price: 201.74 USD
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Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

PUBLISH DATE 2019

PAGES 48

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

IEC 60749-18:2019 is also available as IEC 60749-18:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used.

This document addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and aerospace-related applications. It is a destructive test.

This edition includes the following significant technical changes with respect to the previous edition:

updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing;
addition of a Bibliography, which includes ASTM standards relevant to this test method.