IEC 61000-4-15 Ed. 2.0 b:2010

Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications

IEC 61000-4-15:2010 gives a functional and design specification for flicker measuring apparatus intended to indicate the correct flicker perception level for all practical voltage fluctuation waveforms. Information is presented to enable such an instrument to be constructed. A method is given for the evaluation of flicker severity on the basis of the output of flickermeters complying with this standard.

The flickermeter specifications in this part of IEC 61000 relate only to measurements of 120 V and 230 V, 50 Hz and 60 Hz inputs. Characteristics of some incandescent lamps for other voltages are sufficiently similar to the values in Table 1 and Table 2, that the use of a correction factor can be applied for those other voltages. Some of these correction factors are provided in the Annex B. Detailed specifications for voltages and frequencies other than those given above, remain under consideration.

The object of this part of IEC 61000 is to provide basic information for the design and the instrumentation of an analogue or digital flicker measuring apparatus. It does not give tolerance limit values of flicker severity.

This second edition cancels and replaces the first edition published in 1997 and its Amendment 1 (2003) and constitutes a technical revision. This new edition, in particular, adds or clarifies the definition of several directly measured parameters, so that diverging interpretations are avoided. It has the status of a basic EMC publication in accordance with IEC Guide 107.

IEC 61000-4-14 Ed. 1.1 b:2002 Electromagnetic compatibility (EMC) - Part 4-14: Testing and measurement techniques - Voltage fluctuation immunity test

Applies to electrical and/or electronic equipment that have a rated input current up to 16 A per phase. Aims to establish a reference for evaluating the immunity of electric and/or electronic equipment when subjected to positive and negative low amplitude voltage fluctuations. Only conducted phenomena are considered, including immunity tests for equipment connected to public and industrial power supply networks.

Has the status of a Basic EMC publication.

IEC 61587-4 Ed. 1.0 b:2012 Mechanical structures for electronic equipment - Tests for IEC 60917 and IEC 60297 series - Part 4: Combination of performance levels for modular cabinets

IEC 61587-4:2012 provides the combinations of different degrees of protection for cabinet systems regarding IP code, climate levels, static and dynamics load tests, electromagnetic shielding and seismic requirements.

Optimal economical solution can be ensured by ordering a cabinet with specific properties for which this design guide provides the easy selection of defined performance levels.

Keywords: Modular cabinets

IEC 61754-22 Ed. 1.0 b:2005 Fibre optic connector interfaces - Part 22: Type F-SMA connector family

This part of IEC 61754 defines the standard interface dimensions for the type F-SMA family of connectors.

IEC 61754-21 Ed. 1.0 b:2005 Fibre optic connector interfaces - Part 21: Type SMI connector family for plastic optical fibre

Defines the standard interface dimensions for the type SMI (small multimedia interface) family of connectors.

IEC 60191-6-19 Ed. 1.0 b:2010 Mechanical standardization of semiconductor devices - Part 6-19: Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage

IEC 60191-6-19:2010 specifies measurement methods of the package warpage at elevated temperature and the maximum permissible warpages for Ball Grid Array (BGA), Fine-pitch Ball Grid Array (FBGA), and Fine-pitch Land Grid Array (FLGA). This standard cancels and replaces IEC/PAS 60191-6-19 published in 2008. This first edition constitutes a technical revision.