IEC 61000-4-8 Ed. 2.0 b:2009

Current Revision
Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test

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Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test

PUBLISH DATE 2012
PAGES 92

Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test

IEC 61000-4-8:2009 relates to the immunity requirements of equipment, only under operational conditions, to magnetic disturbances at power frequencies 50 Hz and 60 Hz related to:

  • residential and commercial locations;
  • industrial installations and power plants;
  • medium voltage and high voltage sub-stations.

The applicability of IEC 61000-4-8:2009 to equipment installed in different locations is determined by the presence of the phenomenon, as specified in Clause 4. This standard does not consider disturbances due to capacitive or inductive coupling in cables or other parts of the field installation. Other IEC standards dealing with conducted disturbances cover these aspects.

The object of IEC 61000-4-8:2009 is to establish a common and reproducible basis for evaluating the performance of electrical and electronic equipment for household, commercial and industrial applications when subjected to magnetic fields at power frequency (continuous and short duration field).

IEC 61000-4-8:2009 defines:

  • recommended test levels;
  • test equipment;
  • test set-up;
  • test procedure.

This second edition cancels and replaces the first edition published in 1993 and its Amendment 1 (2000). It forms a technical revision. This edition includes the following significant technical changes with respect to the previous edition: the scope is extended in order to cover 60 Hz. Characteristics, performance and verification of the test generator and related inductive coils are revised. Modifications are also introduced in the test set-up (GRP) and test procedure.

IEC 61000-4-8:2009 has the status of a basic EMC publication in accordance with IEC Guide 107.

IEC 62615 Ed. 1.0 b:2010 Electrostatic discharge sensitivity testing - Transmission line pulse (TLP) - Component level

IEC 62615:2010 defines a method for pulse testing to evaluate the voltage current response of the component under test and to consider protection design parameters for electro-static discharge (ESD) human body model (HBM). This technique is known as transmission line pulse (TLP) testing. This document establishes a methodology for both testing and reporting information associated with transmission line pulse (TLP) testing.

The scope and focus of this document pertains to TLP testing techniques of semiconductor components. This document should not become alternative method of HBM test standard such as IEC 60749-26. The purpose of the document is to establish guidelines of TLP methods that allow the extraction of HBM ESD parameters on semiconductor devices.

This document provides the standard measurement and procedure for the correct extraction of HBM ESD parameters by using TLP.

IEC/TR 61340-2-2 Ed. 1.0 b:2000 Electrostatics - Part 2-2: Measurement methods - Measurement of chargeability

Describes the equipment, arrangement and procedures for measurement of electrostatic charge caused by contact and relative motion between materials and presents examples of model experiment to simulate practical processes.

IEC/TR 62433-2-1 Ed. 1.0 b:2010 EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission

IEC/TR 62433-2-1:2010 covers black box modelling which has the potential to make the modelling of conducted emission very simple, very fast, and can provide complete protection of proprietary information of IC vendors. This technical report is intended to provide the theoretical background on black box modelling for IC conducted emission.

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