IEC 61338-1-5 Ed. 1.0 b:2015

Current Revision

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

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IEC 61338-1-5 Ed. 1.0 b:2015

Name: IEC 61338-1-5 Ed. 1.0 b:2015 – Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
Brand: International Electrotechnical Commission
SKU: IEC 61338-1-5 Ed. 1.0 b:2015
Price: 145.53 USD
Availability: InStock

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

PUBLISH DATE 2015

PAGES 44

Waveguide type dielectric resonators - Part 1-5: General information and test conditions.

Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency.

IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity.

This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010.

This edition includes the following significant technical changes with respect to the previous edition:

a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction;
b) changes to normative references;
c) addition to bibliography.