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IEC 61580-9 Ed. 1.0 b:1996

Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces
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IEC 61580-9 Ed. 1.0 b:1996

Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces

PUBLISH DATE 1996
IEC 61580-9 Ed. 1.0 b:1996
Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces
Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.
SDO IEC: International Electrotechnical Commission
Document Number IEC 61580
Publication Date June 1, 1996
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 46F
Publish Date Document Id Type View
June 5, 2024 Revision
June 1, 1996 IEC 61580-9 Ed. 1.0 b:1996 Revision