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IEC 61671 Ed. 1.0 en:2012

Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
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IEC 61671 Ed. 1.0 en:2012

Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

PUBLISH DATE 2012
PAGES 394
IEC 61671 Ed. 1.0 en:2012
Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
IEC 61671:2012(E) defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.
SDO IEC: International Electrotechnical Commission
Document Number IEC 61671
Publication Date June 21, 2012
Language en - English
Page Count 394
Revision Level 1.0
Supercedes
Committee 91
Publish Date Document Id Type View
June 21, 2012 Revision
June 21, 2012 IEC 61671 Ed. 1.0 en:2012 Revision