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IEC 61788-17 Ed. 2.0 en:2021

Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
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IEC 61788-17 Ed. 2.0 en:2021

Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films

PUBLISH DATE 2021
PAGES 46
IEC 61788-17 Ed. 2.0 en:2021
Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
IEC 61788-17:2021 is available as IEC 61788-17:2021 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61788-17:2021 specifies the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows.
- Jcd: from 200 A/m to 32 kA/m (based on results, not limitation).
- Measurement resolution: 100 A/m (based on results, not limitation).
SDO IEC: International Electrotechnical Commission
Document Number IEC 61788
Publication Date April 1, 2021
Language en - English
Page Count 46
Revision Level 2.0
Supercedes
Committee 90
Publish Date Document Id Type View
April 1, 2021 Revision
April 1, 2021 IEC 61788-17 Ed. 2.0 en:2021 Revision
Not Available Revision
Not Available Revision
June 5, 2024 Revision
Not Available IEC 61788-17 Ed. 2.0 b:2021 Revision