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IEC 61788-24 Ed. 1.0 b:2018

Superconductivity - Part 24: Critical current measurement - Retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires
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IEC 61788-24 Ed. 1.0 b:2018

Superconductivity - Part 24: Critical current measurement - Retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires

PUBLISH DATE 2018
PAGES 62
IEC 61788-24 Ed. 1.0 b:2018
Superconductivity - Part 24: Critical current measurement - Retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires
IEC 61788-24:2018 describes a test method for determining the retained critical current after double bending at room temperature of short and straight Ag- and/or Ag alloy-sheathed Bi-2223 superconducting wires that have the shape of a flat or square tape containing mono- or multicores of oxides. The wires can be laminated with copper alloy, stainless steel or Ni alloy tapes.
The test method is intended for use with superconductors that have a critical current less than 300 A and an n-value larger than 5.
SDO IEC: International Electrotechnical Commission
Document Number IEC 61788
Publication Date June 1, 2018
Language b - English & French
Page Count 62
Revision Level 1.0
Supercedes
Committee 90
Publish Date Document Id Type View
June 1, 2018 IEC 61788-24 Ed. 1.0 b:2018 Revision
June 1, 2018 Revision