IEC 62132-4 Ed. 1.0 b:2006

Current Revision
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

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Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

PUBLISH DATE 2006
PAGES 58

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

Describes a method to measure the *immunity of integrated circuits (IC)* in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances.

This method guarantees a *high degree of repeatability and correlation* of immunity measurements.

This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.

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