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IEC 62228-2 Ed. 1.0 b:2016

Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
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IEC 62228-2 Ed. 1.0 b:2016

Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

PUBLISH DATE 2016
PAGES 90
IEC 62228-2 Ed. 1.0 b:2016
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
IEC 62228-2:2016 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers:
- the emission of RF disturbances,
- the immunity against RF disturbances,
- the immunity against impulses and
- the immunity against electrostatic discharges (ESD).
SDO IEC: International Electrotechnical Commission
Document Number IEC 62228
Publication Date Nov. 1, 2016
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47A
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