IEC 62228-2 Ed. 1.0 b:2016

Current Revision
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

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Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

PUBLISH DATE 2016
PAGES 90

Integrated circuits - EMC evaluation of transceivers

Part 2: LIN transceivers

IEC 62228-2:2016 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition.

It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards.

It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers:

  • the emission of RF disturbances,
  • the immunity against RF disturbances,
  • the immunity against impulses, and
  • the immunity against electrostatic discharges (ESD).
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