IEC 62374 Ed. 1.0 b:2007

Current Revision
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

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Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

PUBLISH DATE 2007
PAGES 46

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices.

Also details a product lifetime estimation method of TDDB failure.

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