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IEC 62374 Ed. 1.0 b:2007

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
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IEC 62374 Ed. 1.0 b:2007

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

PUBLISH DATE 2007
PAGES 46
IEC 62374 Ed. 1.0 b:2007
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure
SDO IEC: International Electrotechnical Commission
Document Number IEC 62374
Publication Date March 1, 2007
Language b - English & French
Page Count 46
Revision Level 1.0
Supercedes
Committee 47
Publish Date Document Id Type View
March 1, 2007 IEC 62374 Ed. 1.0 b:2007 Revision
March 1, 2007 Revision