IEC 62415 Ed. 1.0 b:2010

Current Revision
Semiconductor devices - Constant current electromigration test

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Semiconductor devices - Constant current electromigration test

PUBLISH DATE 2010
PAGES 26

Semiconductor devices - Constant current electromigration test

IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

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