IEC 62416 Ed. 1.0 b:2010

Current Revision
Semiconductor devices - Hot carrier test on MOS transistors

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Semiconductor devices - Hot carrier test on MOS transistors

PUBLISH DATE 2010
PAGES 24

Semiconductor devices - Hot carrier test on MOS transistors.

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors.

The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

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