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IEC 62416 Ed. 1.0 b:2010

Semiconductor devices - Hot carrier test on MOS transistors
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IEC 62416 Ed. 1.0 b:2010

Semiconductor devices - Hot carrier test on MOS transistors

PUBLISH DATE 2010
PAGES 24
IEC 62416 Ed. 1.0 b:2010

Semiconductor devices - Hot carrier test on MOS transistors.

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors.

The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

SDO IEC: International Electrotechnical Commission
Document Number IEC 62416
Publication Date April 1, 2010
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47
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