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IEC 62435-2 Ed. 1.0 b:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
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IEC 62435-2 Ed. 1.0 b:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

PUBLISH DATE 2017
PAGES 40
IEC 62435-2 Ed. 1.0 b:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied.

This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms.

Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

SDO IEC: International Electrotechnical Commission
Document Number IEC 62435
Publication Date Jan. 1, 2017
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47
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