IEC 62525 Ed. 1.0 en:2007

Current Revision
Standard Test Interface Language (STIL) for Digital Test Vector Data

Best Price Guarantee Nov 1, 2007 English 148 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00
View in Library
or
International Electrotechnical Commission Logo

Standard Test Interface Language (STIL) for Digital Test Vector Data

PUBLISH DATE 2007
PAGES 148

Standard Test Interface Language (STIL) for Digital Test Vector Data

Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment (ATE) environments;

Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT);

Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

Loading...

Failed to load document history.

Publish Date Document Id Type View