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Standard Test Interface Language (STIL) for Digital Test Vector Data
Standard Test Interface Language (STIL) for Digital Test Vector Data
Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment (ATE) environments;
Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT);
Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.
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