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IEC 62525 Ed. 1.0 en:2007

Standard Test Interface Language (STIL) for Digital Test Vector Data
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IEC 62525 Ed. 1.0 en:2007

Standard Test Interface Language (STIL) for Digital Test Vector Data

PUBLISH DATE 2007
PAGES 148
IEC 62525 Ed. 1.0 en:2007

Standard Test Interface Language (STIL) for Digital Test Vector Data

Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment (ATE) environments;

Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT);

Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

SDO IEC: International Electrotechnical Commission
Document Number IEC 62525
Publication Date Nov. 1, 2007
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 91
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