IEC 62526 Ed. 1.0 en:2007

Current Revision
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

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Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

PUBLISH DATE 2007
PAGES 128

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Provides an interface between digital test generation tools and test equipment.

A test description language is defined that:

  • (a) facilitates the transfer of digital test vector data from CAE to ATE environments;
  • (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and
  • (c) supports the volume of test vector data generated from structured tests.
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