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IEC 62526 Ed. 1.0 en:2007

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
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IEC 62526 Ed. 1.0 en:2007

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

PUBLISH DATE 2007
PAGES 128
IEC 62526 Ed. 1.0 en:2007

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Provides an interface between digital test generation tools and test equipment.

A test description language is defined that:

  • (a) facilitates the transfer of digital test vector data from CAE to ATE environments;
  • (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and
  • (c) supports the volume of test vector data generated from structured tests.
SDO IEC: International Electrotechnical Commission
Document Number IEC 62526
Publication Date Nov. 1, 2007
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 91
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