IEC 62527 Ed. 1.0 en:2007

Current Revision
Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

Best Price Guarantee Nov 1, 2007 English 44 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00
View in Library
or
International Electrotechnical Commission Logo

Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

PUBLISH DATE 2007
PAGES 44

Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on automated test equipment (ATE).

STIL language extensions include structures for:

  • specifying the DC conditions for a device under test;
  • specifying DC conditions either globally, by pattern burst, by pattern, or by vector;
  • specifying alternate DC levels; and
  • selecting DC levels and alternate levels within a period, much the same as timed format events.
Loading...

Failed to load document history.

Publish Date Document Id Type View