IEC 62878-1-1 Ed. 1.0 b:2015

Current Revision
Device embedded substrate - Part 1-1: Generic specification - Test methods

Best Price Guarantee May 20, 2015 EN/FR 114 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00
View in Library
or
International Electrotechnical Commission Logo

Device embedded substrate - Part 1-1: Generic specification - Test methods

PUBLISH DATE 2015
PAGES 114

Device embedded substrate - Part 1-1: Generic specification - Test methods

IEC 62878-1-1:2015 specifies the test methods of passive and active device embedded substrates.

The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3.

This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include, for example, active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

Loading...

Failed to load document history.

Publish Date Document Id Type View