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IEC 62899-402-1 Ed. 2.0 en:2025

Printed electronics - Part 402-1: Printability - Measurement of qualities - Line pattern widths
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IEC 62899-402-1 Ed. 2.0 en:2025

Printed electronics - Part 402-1: Printability - Measurement of qualities - Line pattern widths

IEC 62899-402-1 Ed. 2.0 en:2025

IEC 62899-402-1:2025 specifies the measurement methods of the width of line pattern and spaces between the line patterns in printed electronics. These printed line patterns are treated as two-dimensional on a substrate.

When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for vertical variance in printed electronics.

This edition includes the following significant technical changes with respect to the previous edition:

  • a) The title is changed from 'Printability – Measurement of qualities – Pattern width' to 'Printability – Measurement of qualities – Line pattern width'.
  • b) The term 'pattern width' is specified as 'line pattern width'.
  • c) The measurement method of line pattern space is included.
  • d) The definition and measurement of inner/outer edge lines are removed.
SDO IEC: International Electrotechnical Commission
Document Number IEC 62899
Publication Date Not Available
Language en - English
Page Count 20
Revision Level 2.0
Supercedes
Committee 119
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