IEC 62899-402-8 Ed. 1.0 en:2026

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Printed electronics - Part 402-8: Printability - Measurement of qualities - Shape pattern dimension

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Printed electronics - Part 402-8: Printability - Measurement of qualities - Shape pattern dimension

PUBLISH DATE 2026

IEC 62899-402-8:2026 specifies the measurement methods of the dimensions of the shape patterns in printed electronics. These printed patterns are treated as two-dimensional on a substrate.

When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for vertical variance in IEC TR 62899 402 4 in printed electronics.

NOTE The measurement methods of dimensions of the shape patterns considering three-dimensional characteristics can be developed later after the measurement methods for vertical variance are established.

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