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IEC 62899-503-1 Ed. 1.0 en:2020

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
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IEC 62899-503-1 Ed. 1.0 en:2020

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

PUBLISH DATE 2020
PAGES 20
IEC 62899-503-1 Ed. 1.0 en:2020

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).

SDO IEC: International Electrotechnical Commission
Document Number IEC 62899
Publication Date May 1, 2020
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 119
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