IEC 62951-6 Ed. 1.0 b:2019

Current Revision
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films

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Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films

PUBLISH DATE 2019
PAGES 54

Semiconductor devices - Flexible and stretchable semiconductor devices

Part 6: Test method for sheet resistance of flexible conducting films

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests.

The measurement methods include the 2-point probe, 4-point probe, and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

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