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IEC 62951-7 Ed. 1.0 b:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
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IEC 62951-7 Ed. 1.0 b:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor

PUBLISH DATE 2019
PAGES 32
IEC 62951-7 Ed. 1.0 b:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor

IEC 62951-7:2019 specifies evaluation conditions and gives a method of measurement as well as a test set-up for the measurement of barrier performance for thin-film layer with ultra low permeation rate under both flat and bending conditions.

This document also includes the preparation of specimen, electrical contacts, sensor films and calculation procedures.

For these purposes, this document provides terms, definitions, symbols, configurations, and test methods including test conditions such as temperature, relative humidity, testing time.

SDO IEC: International Electrotechnical Commission
Document Number IEC 62951
Publication Date Feb. 1, 2019
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47
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