IEC 62951-8 Ed. 1.0 en:2023

Current Revision
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

Best Price Guarantee Jan 1, 2023 English 18 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00
View in Library
or
International Electrotechnical Commission Logo

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

PUBLISH DATE 2023
PAGES 18

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory.

IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory.

The test method descriptions include experimental procedures and the equipment to be used.

It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment.

The test method described in this document focuses on stability evaluation rather than reliability.

Loading...

Failed to load document history.

Publish Date Document Id Type View