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IEC 62951-8 Ed. 1.0 en:2023

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
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IEC 62951-8 Ed. 1.0 en:2023

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

PUBLISH DATE 2023
PAGES 18
IEC 62951-8 Ed. 1.0 en:2023

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory.

IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory.

The test method descriptions include experimental procedures and the equipment to be used.

It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment.

The test method described in this document focuses on stability evaluation rather than reliability.

SDO IEC: International Electrotechnical Commission
Document Number IEC 62951
Publication Date Jan. 1, 2023
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 47
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