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IEC 62969-4 Ed. 1.0 b:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
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IEC 62969-4 Ed. 1.0 b:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

PUBLISH DATE 2018
PAGES 44
IEC 62969-4 Ed. 1.0 b:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface.

That method can be used to support the conformance assurance in the vehicle communications interface.

SDO IEC: International Electrotechnical Commission
Document Number IEC 62969
Publication Date June 1, 2018
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47
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