IEC 63003 Ed. 1.0 en:2015

Current Revision
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

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Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

PUBLISH DATE 2015
PAGES 176

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI).

The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

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