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IEC 63003 Ed. 1.0 en:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

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IEC 63003 Ed. 1.0 en:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

PUBLISH DATE 2015

PAGES 176

Document Information

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.


SDO	IEC: International Electrotechnical Commission
Document Number	IEC 63003
Publication Date	Dec. 1, 2015
Language	en - English
Page Count	176
Revision Level	1.0
Supercedes
Committee	91

Publish Date	Document Id	Type	View
Dec. 1, 2015		Revision
Dec. 1, 2015	IEC 63003 Ed. 1.0 en:2015	Revision

SDO	Document	Title
IEEE	IEEE 1505.1	IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
IEEE	IEEE/IEC 63003	IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
IEEE	IEEE 1505.3	IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
BSI	BSI BS IEC 63003	Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505<sup>TM</sup>
IEEE	IEEE 1450.3	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
IEEE	IEEE 1450.2	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
IEEE	IEEE 1505	IEEE Standard for Receiver Fixture Interface
IEEE	IEEE C37.100.2	IEEE Standard for Common Requirements for Testing of AC Capacitive Current Switching Devices over 1000 V
IEEE	IEEE C37.100.1	IEEE Standard of Common Requirements for High Voltage Power Switchgear Rated Above 1000 V
IEEE	IEEE 1450.6	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
IEEE	IEEE 48	IEEE Standard Test Procedures and Requirements for High-Voltage Alternating-Current Cable Terminations
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IEEE	IEEE 1450	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
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AMPP	NACE SP0315-IEEE Std 1835	NACE/IEEE Joint Standard Practice for Below-Grade Inspection and Assessment of Corrosion on Steel Transmission, Distribution, and Substation Structures
IEEE	IEEE C37.34e	IEEE Standard Test Code for High-Voltage Air Switches (Supplement: Switching-Impulse Testing of Extra-High voltage Switches)
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