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IEC 63011-2 Ed. 1.0 b:2018

Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect
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IEC 63011-2 Ed. 1.0 b:2018

Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect

PUBLISH DATE 2018
PAGES 32
IEC 63011-2 Ed. 1.0 b:2018
Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect

IEC 63011-2:2018 provides specifications of initial alignment and alignment maintenance between multiple stacked integrated circuits during the die bonding process. These specifications define the alignment keys and operating procedures of the keys. These specifications apply only if electrical coupling method of die-to-die alignment is used in the die stacking.

SDO IEC: International Electrotechnical Commission
Document Number IEC 63011
Publication Date Nov. 28, 2018
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47A
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