Logo
Login Sign Up
Current Revision

IEC 63287-1 Ed. 1.0 b:2021

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
Best Price Guarantee

$372.68

2-5 Days

$372.68

SAVE 10%

$670.82


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
International Electrotechnical Commission Logo

IEC 63287-1 Ed. 1.0 b:2021

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification

PUBLISH DATE 2021
PAGES 90
IEC 63287-1 Ed. 1.0 b:2021

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification

IEC 63287-1:2021 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications.

NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.

NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.

This first edition of IEC 63287-1 cancels and replaces the first edition of IEC 60749-43 published in 2017. This edition constitutes a technical revision.

This edition includes the following significant technical changes with respect to the previous edition:

  1. the document has been renamed and renumbered to distinguish it from the IEC 60749 (all parts);
  2. a new section concerning the concept of "family" has been added with appropriate renumbering of the existing text.
SDO IEC: International Electrotechnical Commission
Document Number IEC 63287
Publication Date Aug. 1, 2021
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47
Loading...

Failed to load document history.

Publish Date Document Id Type View