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IEC 63364-1 Ed. 1.0 b:2022

Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
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IEC 63364-1 Ed. 1.0 b:2022

Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection

PUBLISH DATE 2022
PAGES 28
IEC 63364-1 Ed. 1.0 b:2022

Semiconductor devices - Semiconductor devices for IoT system - Part 1:

Test method of sound variation detection

IEC 63364-1:2022 specifies terms, the test method, and the report of sound variation detection system based on IoT.

It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions.

In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.

SDO IEC: International Electrotechnical Commission
Document Number IEC 63364
Publication Date Dec. 1, 2022
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47
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