Soft ferrite material classification

Marking on ferrite cores

Distribution automation using distribution line carrier systems - Part 3-1: Mains signalling requirements - Frequency bands and output levels

Distribution automation using distribution line carrier systems - Part 3: Mains signalling requirements - Section 21: MV phase-to-phase isolated capacitive coupling device

Distribution automation using distribution line carrier systems - Part 3-22: Mains signalling requirements - MV phase-to-earth and screen-to-earth intrusive coupling devices

Distribution automation using distribution line carrier systems - Part 4: Data communication protocols - Section 1: Reference model of the communication system

Distribution automation using distribution line carrier systems - Part 4: Data communication protocols - Section 32: Data link layer - Logical link control (LLC)

Distribution automation using distribution line carrier systems - Part 4-33: Data communication protocols - Data link layer - Connection oriented protocol

Distribution automation using distribution line carrier systems - Part 4: Data communication protocols - Section 41: Application protocol - Distribution line message specification

Distribution automation using distribution line carrier systems - Part 4: Data communication protocols - Section 42: Application protocols - Application layer

Distribution automation using distribution line carrier systems - Part 4-511: Data communication protocols - Systems management - CIASE protocol

Distribution automation using distribution line carrier systems - Part 4-512: Data communication protocols - System management using profile 61334-5-1 - Management Information Base (MIB)

Distribution automation using distribution line carrier systems - Part 4-61: Data communication protocols - Network layer - Connectionless protocol

Distribution automation using distribution line carrier systems - Part 5-1: Lower layer profiles - The spread frequency shift keying (S-FSK) profile

Distribution automation using distribution line carrier systems - Part 6: A-XDR encoding rule

Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis

Nuclear instrumentation - Thickness measurement systems utilizing ionizing radiation - Definitions and test methods

Filters using waveguide type dielectric resonators - Part 1: Generic specification

Filters using waveguide type dielectric resonators - Part 2: Guidance for use

Waveguide type dielectric resonators - Part 1: Generic specification

Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency

Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

Waveguide type dielectric resonators - Part 4: Sectional specification