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IEC 60749-41 Ed. 1.0 b:2020
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
IEC 60749-41 Ed. 1.0 b:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

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IEC 60749-42 Ed. 1.0 b:2014
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
IEC 60749-42 Ed. 1.0 b:2014

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

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IEC 60749-44 Ed. 1.0 b:2016
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
IEC 60749-44 Ed. 1.0 b:2016

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

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IEC 60749-5 Ed. 3.0 b:2023
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
IEC 60749-5 Ed. 3.0 b:2023

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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IEC 60749-6 Ed. 2.0 en:2017
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
IEC 60749-6 Ed. 2.0 en:2017

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

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IEC 60749-7 Ed. 3.0 b:2025
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
IEC 60749-7 Ed. 3.0 b:2025

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

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IEC 60749-8 Ed. 1.0 b:2002
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
IEC 60749-8 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

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IEC 60749-9 Ed. 2.0 en:2017
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
IEC 60749-9 Ed. 2.0 en:2017

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

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IEC 60754-1 Ed. 3.1 b:2019
Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content
IEC 60754-1 Ed. 3.1 b:2019

Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content

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IEC 60754-2 Ed. 2.1 b:2019
Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity
IEC 60754-2 Ed. 2.1 b:2019

Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity

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IEC 60754-3 Ed. 1.0 en:2018
Test on gases evolved during combustion of materials from cables - Part 3: Measurement of low level of halogen content by ion chromatography
IEC 60754-3 Ed. 1.0 en:2018

Test on gases evolved during combustion of materials from cables - Part 3: Measurement of low level of halogen content by ion chromatography

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IEC 60755 Ed. 1.0 en:2017
General safety requirements for residual current operated protective devices
IEC 60755 Ed. 1.0 en:2017

General safety requirements for residual current operated protective devices

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IEC 60755-1 Ed. 1.0 en:2022
General safety requirements for residual current operated protective devices - Part 1: Residual current operated protective devices for DC systems
IEC 60755-1 Ed. 1.0 en:2022

General safety requirements for residual current operated protective devices - Part 1: Residual current operated protective devices for DC systems

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IEC 60756 Ed. 2.0 b:1991
Non-broadcast video tape recorders - Time base stability
IEC 60756 Ed. 2.0 b:1991

Non-broadcast video tape recorders - Time base stability

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IEC 60757 Ed. 2.0 b:2021
Code for designation of colours
IEC 60757 Ed. 2.0 b:2021

Code for designation of colours

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IEC 60759 Ed. 1.0 b:1983
Standard test procedures for semiconductor X-ray energy spectrometers
IEC 60759 Ed. 1.0 b:1983

Standard test procedures for semiconductor X-ray energy spectrometers

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IEC 60761-1 Ed. 2.0 b:2002
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements
IEC 60761-1 Ed. 2.0 b:2002

Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements

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IEC 60761-2 Ed. 3.0 b:2026
Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 2: Specific requirements for radioactive aerosol monitors including transuranic aerosols
IEC 60761-2 Ed. 3.0 b:2026

Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 2: Specific requirements for radioactive aerosol monitors including transuranic aerosols

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IEC 60761-3 Ed. 2.0 b:2002
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 3: Specific requirements for radioactive noble gas monitors
IEC 60761-3 Ed. 2.0 b:2002

Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 3: Specific requirements for radioactive noble gas monitors

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IEC 60761-4 Ed. 2.0 b:2002
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 4: Specific requirements for radioactive iodine monitors
IEC 60761-4 Ed. 2.0 b:2002

Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 4: Specific requirements for radioactive iodine monitors

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IEC 60761-5 Ed. 2.0 b:2002
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 5: Specific requirements for tritium monitors
IEC 60761-5 Ed. 2.0 b:2002

Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 5: Specific requirements for tritium monitors

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IEC 60763-1 Ed. 2.0 b:2010
Laminated pressboard for electrical purposes - Part 1: Definitions, classification and general requirements
IEC 60763-1 Ed. 2.0 b:2010

Laminated pressboard for electrical purposes - Part 1: Definitions, classification and general requirements

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IEC 60763-2 Ed. 2.1 b:2023
Amendment 1 - Specification for laminated pressboard - Part 2: Methods of test
IEC 60763-2 Ed. 2.1 b:2023

Amendment 1 - Specification for laminated pressboard - Part 2: Methods of test

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IEC 60763-3-1 Ed. 2.0 b:2010
Laminated pressboard for electrical purposes - Part 3: Specifications for individual materials - Sheet 1: Requirements for laminated precompressed pressboard, Types LB3.1A.1 and LB3.1A.2
IEC 60763-3-1 Ed. 2.0 b:2010

Laminated pressboard for electrical purposes - Part 3: Specifications for individual materials - Sheet 1: Requirements for laminated precompressed pressboard, Types LB3.1A.1 and LB3.1A.2

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IEC 60767 Ed. 1.0 b:1983
Helical-scan video-tape cassette system using 12.65 mm (0.5 in) magnetic tape on type beta-format
IEC 60767 Ed. 1.0 b:1983

Helical-scan video-tape cassette system using 12.65 mm (0.5 in) magnetic tape on type beta-format

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