+1 888 608-7511
Need help finding a standard?
Help Desk
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ohm/150 Ohm direct coupling method - Application guidance to IEC 61967-4"
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz
Part 4-1: Measurement of conducted emissions - 1 Ohm/150 Ohm direct coupling method
Application guidance to IEC 61967-4
Serves as an application guidance and relates to IEC 61967-4. The division of IC types into IC function modules and the software modules for cores with CPU can be used for Parts 3, 5 and 6 of IEC 61967.
Gives advice for performing test methods described in IEC 61967-4 by classifying types of integrated circuits (ICs) and providing hints for test applications related to the IC type classification.
To obtain comparable results of IC emission measurements using IEC 61967-4, definitions are given which are in addition to the general conditions specified in IEC 61967-1 and IEC 61967-4. These definitions concern:
Parts of the guidance provided by this technical report may be applicable to other parts of IEC 61967.
Failed to load document history.
| Publish Date | Document Id | Type | View |
|---|