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IEC/TR 61967-4-1 Ed. 1.0 en:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ohm/150 Ohm direct coupling method - Application guidance to IEC 61967-4"
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IEC/TR 61967-4-1 Ed. 1.0 en:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ohm/150 Ohm direct coupling method - Application guidance to IEC 61967-4"

PUBLISH DATE 2005
IEC/TR 61967-4-1 Ed. 1.0 en:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz

Part 4-1: Measurement of conducted emissions - 1 Ohm/150 Ohm direct coupling method

Application guidance to IEC 61967-4

Serves as an application guidance and relates to IEC 61967-4. The division of IC types into IC function modules and the software modules for cores with CPU can be used for Parts 3, 5 and 6 of IEC 61967.

Gives advice for performing test methods described in IEC 61967-4 by classifying types of integrated circuits (ICs) and providing hints for test applications related to the IC type classification.

To obtain comparable results of IC emission measurements using IEC 61967-4, definitions are given which are in addition to the general conditions specified in IEC 61967-1 and IEC 61967-4. These definitions concern:

  • IC related operating modes,
  • pins and ports to be tested,
  • test set-ups according IEC 61967-4, including description of load circuits and RF path,
  • and IC related emission limits (or limit classes).

Parts of the guidance provided by this technical report may be applicable to other parts of IEC 61967.

SDO IEC: International Electrotechnical Commission
Document Number IEC/TR 61967
Publication Date Feb. 1, 2005
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 47A
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