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IEC/TR 62878-2-2 Ed. 1.0 b:2015

Device embedded substrate - Part 2-2: Guidelines - Electrical testing
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IEC/TR 62878-2-2 Ed. 1.0 b:2015

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

PUBLISH DATE 2015
IEC/TR 62878-2-2 Ed. 1.0 b:2015

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate.

This includes the interconnection open- and short-circuit tests as well as the device functional test.

It also provides guidelines by demonstrating the electrical test for device embedded substrate.

SDO IEC: International Electrotechnical Commission
Document Number IEC/TR 62878
Publication Date Dec. 1, 2015
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 91
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