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IEC/TR 63133 Ed. 1.0 en:2017

Semiconductor devices - Scan based ageing level estimation for semiconductor devices
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IEC/TR 63133 Ed. 1.0 en:2017

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

PUBLISH DATE 2017
IEC/TR 63133 Ed. 1.0 en:2017

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level.

The estimated ageing level can be used to improve the reliability of system.

SDO IEC: International Electrotechnical Commission
Document Number IEC/TR 63133
Publication Date Oct. 1, 2017
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 47
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