IEC/TR 63571 Ed. 1.0 en:2025

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Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”

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Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”

IEC TR 63571:2025 describes a method to calculate “SYSTEM”-level lifetime from “PART”-level lifetime.

It presents a general mathematical theory and simple calculation examples for educational purposes.

Of the elements related to “SYSTEM”-level lifetime, software-related elements such as diagnostics are outside the scope of this document.

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