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IEC/TR 63571 Ed. 1.0 en:2025

Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”
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IEC/TR 63571 Ed. 1.0 en:2025

Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”

IEC/TR 63571 Ed. 1.0 en:2025

IEC TR 63571:2025 describes a method to calculate “SYSTEM”-level lifetime from “PART”-level lifetime.

It presents a general mathematical theory and simple calculation examples for educational purposes.

Of the elements related to “SYSTEM”-level lifetime, software-related elements such as diagnostics are outside the scope of this document.

SDO IEC: International Electrotechnical Commission
Document Number IEC/TR 63571
Publication Date Not Available
Language en - English
Page Count 28
Revision Level 1.0
Supercedes
Committee 47
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