Logo
Login Sign Up
Current Revision

IEC/TS 61586 Ed. 2.0 b:2017

Estimation of the reliability of electrical connectors
Best Price Guarantee

$264.88

2-5 Days

$264.88

SAVE 10%

$476.78


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
International Electrotechnical Commission Logo

IEC/TS 61586 Ed. 2.0 b:2017

Estimation of the reliability of electrical connectors

PUBLISH DATE 2017
IEC/TS 61586 Ed. 2.0 b:2017

Estimation of the reliability of electrical connectors

IEC TS 61586:2017 deals with the estimation of the inherent design reliability of electrical connectors through the definition and development of an appropriate accelerated testing programme.

The basic intrinsic degradation mechanisms of connectors, which are those mechanisms which exist as a result of the materials and geometries chosen for the connector design, are reviewed to provide a context for the development of the desired test programme.

While extrinsic degradation mechanisms may also significantly affect the performance of connectors, they vary widely by application and thus are not addressed in this document.

This second edition cancels and replaces the first edition published in 1997. This edition constitutes a technical revision.

The main technical changes with regard to the previous edition are as follows:

  • A specific “basic” testing protocol is defined which utilizes a single test group subjecting connectors to multiple stresses,
  • Additional information is provided concerning test acceleration factors,
  • A discussion of the limitations of providing MTTF/MTBF estimates for connectors has been added and the bibliography has been expanded.

Key words: Connectors, Reliability, Intrinsic, Extrinsic

SDO IEC: International Electrotechnical Commission
Document Number IEC/TS 61586
Publication Date Jan. 1, 2017
Language b - English & French
Page Count
Revision Level 2.0
Supercedes
Committee 48
Loading...

Failed to load document history.

Publish Date Document Id Type View