Low-voltage switchgear and controlgear assemblies - Internal arc-fault protection of low-voltage switchgear and controlgear assemblies in accordance with the IEC 61439 series
IEC TS 61641:2026 identifies methods used to verify the ability of the assembly:
This document takes into consideration:
This document describes different methods to assess the performance of an assembly or zones of an assembly in respect of arcing in air due to an internal failure:
IAMS consist of internal arc-fault control devices (IACD), e.g. optical-based IACD's in accordance with IEC 60947-9-2 and internal arc-fault reduction devices (IARD), e.g. arc quenching devices (AQDs) in accordance with IEC 60947-9-1 and short-circuit protection devices (SCPD's) in accordance with IEC 60947-2 (see Figure EE.1). IAMS can be provided by a combined-type device according to IEC 60947-9-2.
IEC 60364-4-42:2024 (Clause 427) provides guidance on the need for internal arc-fault protection.
This document does not supersede any individual product standard. Individual devices are required to comply with their relevant standard.
This document does not apply to integration of arc fault detection devices (AFDD) according to IEC 62606.
Informative Annex AA gives guidance for the user (see IEC 61439-1:2020, 3.11) on internal arc-fault mitigation.
Informative Annex BB gives guidance for the user (see IEC 61439-1:2020, 3.11) of assemblies with "active" arc-fault protection (with the integration of IAMS).
Informative Annex CC gives guidance for the original manufacturer of an assembly when incorporating an integrated IAMS.
This document does not consider other effects which can constitute a risk, such as emission of toxic gases, loud noises and/or intense light. Furthermore, this document does not consider conditions during maintenance work and the personal protective equipment used.
This edition cancels and replaces IEC TR 61641:2014 and IEC TS 63107:2020. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
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