Logo
Login Sign Up
Current Revision

IEC/TS 62878-2-4 Ed. 1.0 b:2015

Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)
Best Price Guarantee
Instant

$427.00

2-5 Days

$427.00

SAVE 10%

$768.60


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
International Electrotechnical Commission Logo

IEC/TS 62878-2-4 Ed. 1.0 b:2015

Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)

PUBLISH DATE 2015
IEC/TS 62878-2-4 Ed. 1.0 b:2015
Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)
IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.
SDO IEC: International Electrotechnical Commission
Document Number IEC/TS 62878
Publication Date March 27, 2015
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 91
Loading...

Failed to load document history.

Publish Date Document Id Type View