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IEC/TS 62916 Ed. 1.0 en:2017

Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing
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IEC/TS 62916 Ed. 1.0 en:2017

Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing

PUBLISH DATE 2017
IEC/TS 62916 Ed. 1.0 en:2017

Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing

IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method.

The test method described subjects a bypass diode to a progressive ESD stress test, and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function.

It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation, or installation processes of PV modules.

SDO IEC: International Electrotechnical Commission
Document Number IEC/TS 62916
Publication Date April 1, 2017
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 82
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