+1 888 608-7511
Need help finding a standard?
Help Desk
Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing
Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing
IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method.
The test method described subjects a bypass diode to a progressive ESD stress test, and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function.
It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation, or installation processes of PV modules.
Failed to load document history.
| Publish Date | Document Id | Type | View |
|---|