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IEEE/IEC 61671-4-2016

IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration
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IEEE/IEC 61671-4-2016

IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration

PUBLISH DATE 2016
PAGES 60
IEEE/IEC 61671-4-2016
Adoption Standard - Active. An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).
SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 61671-4
Publication Date April 8, 2016
Language en - English
Page Count 60
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
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