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IEEE 1445-2016

IEEE Standard for Digital Test Interchange Format (DTIF)
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IEEE 1445-2016

IEEE Standard for Digital Test Interchange Format (DTIF)

PUBLISH DATE 2017
PAGES 64
IEEE 1445-2016

Revision Standard - Active.

The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined.

This information can be broadly grouped into data that defines the following:

  • User under test (UUT) model
  • Stimulus and response
  • Fault dictionary
  • Probe

This standard defines DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing.

These outputs provide a standard exchange format to automatic test equipment (ATE).

This standard is to be used as the standard definition of DATPG output formats and informational content.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1445
Publication Date Jan. 27, 2017
Language en - English
Page Count 64
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
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