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ISO/TR 17055:2002

Steel - Determination of silicon content - Inductively coupled plasma atomic emission spectrometric method
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ISO/TR 17055:2002

Steel - Determination of silicon content - Inductively coupled plasma atomic emission spectrometric method

PUBLISH DATE 2002
ISO/TR 17055:2002

ISO/TR 17055 specifies a method for the determination of the content of silicon in steel by means of inductively coupled plasma emission spectrometry. The method is applicable to silicon contents of mass fraction 0,02 % to 5 %.

The method uses a calibration based on a very close matrix matching of the calibration solutions to the sample and close bracketing of the contents around the approximate concentration of silicon in the sample to be analysed. The concentrations of all elements in the sample has, therefore, to be approximately known.

If the concentrations are not known the sample has to be analysed by some semi quantitative method.

SDO ISO: International Organization for Standardization
Document Number ISO/TR 17055
Publication Date April 1, 2002
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 17/SC 1
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