ISO/TS 23878:2024

Current Revision
Nanotechnologies - Positron annihilation lifetime measurement for nanopore evaluation in materials

Best Price Guarantee Jan 1, 2024 English 28 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00

You own the digital copy of this edition

View in Library
or
International Organization for Standardization Logo

ISO/TS 23878:2024

Nanotechnologies - Positron annihilation lifetime measurement for nanopore evaluation in materials

PUBLISH DATE 2024
ISO/TS 23878:2024

This document describes a method for performing positron annihilation lifetime measurements using a 22Na positron source that decays with + emission.

The + (positron) lifetime is determined from a measurement of the lifetime of the ortho-positronium which ranges from 1 ns to 10 ns (ascribed to a pore size from approximately 0.3 nm to 1.3 nm in diameter), as observed for polymeric materials in which the positronium atoms mostly annihilate via a two-gamma annihilation process.

This document is not applicable to thin surface layers (that are less than several micrometers).

This document does not apply to measuring:

  • non-positronium forming materials;
  • positronium-forming materials that induce a spin conversion reaction;
  • positronium-forming materials that contain chemicals influencing the annihilation process of ortho-positronium by chemical reactions;
  • positronium-forming materials that contain mesoporous silica gels with a large contribution from the three-gamma annihilation process.
Loading...

Failed to load document history.

Publish Date Document Id Type View