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ISO/TS 23878:2024

Nanotechnologies - Positron annihilation lifetime measurement for nanopore evaluation in materials
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ISO/TS 23878:2024

Nanotechnologies - Positron annihilation lifetime measurement for nanopore evaluation in materials

PUBLISH DATE 2024
ISO/TS 23878:2024

This document describes a method for performing positron annihilation lifetime measurements using a 22Na positron source that decays with + emission.

The + (positron) lifetime is determined from a measurement of the lifetime of the ortho-positronium which ranges from 1 ns to 10 ns (ascribed to a pore size from approximately 0.3 nm to 1.3 nm in diameter), as observed for polymeric materials in which the positronium atoms mostly annihilate via a two-gamma annihilation process.

This document is not applicable to thin surface layers (that are less than several micrometers).

This document does not apply to measuring:

  • non-positronium forming materials;
  • positronium-forming materials that induce a spin conversion reaction;
  • positronium-forming materials that contain chemicals influencing the annihilation process of ortho-positronium by chemical reactions;
  • positronium-forming materials that contain mesoporous silica gels with a large contribution from the three-gamma annihilation process.
SDO ISO: International Organization for Standardization
Document Number ISO/TS 23878
Publication Date Jan. 1, 2024
Language en - English
Page Count 28
Revision Level
Supercedes
Committee ISO/TC 229
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