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ISO 16666:2025

Surface chemical analysis - Total reflection X-ray fluorescence - Principles and general requirements
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ISO 16666:2025

Surface chemical analysis - Total reflection X-ray fluorescence - Principles and general requirements

ISO 16666:2025

The document provides the physical principles and specifies instrumental requirements for total reflection X ray fluorescence analysis (TXRF) spectrometers.

This document specifies general procedures for calibration, method development and verification of TXRF measurements and quality control.

The document describes measurements with TXRF conditions having a fixed glancing angle below the critical angle of total reflection and considerably enhanced excitation radiation intensity.

Although certain definitions of grazing incidence geometry are shown for clarification, this document is not applicable to measurement setups working under such conditions.

SDO ISO: International Organization for Standardization
Document Number ISO 16666
Publication Date Not Available
Language en - English
Page Count 30
Revision Level
Supercedes
Committee ISO/TC 201/SC 10
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